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Low-temperature performance of accumulation-mode p-channel wrap-gated FinFETs

Yanbo Zhang1, Yandong Du, Yankun Chen

  • 1Engineering Research Center for Semiconductor Integration Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.

Journal of Nanoscience and Nanotechnology
|May 8, 2013
PubMed

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