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Absorption and backscatter of internal conversion electrons in the measurements of surface contamination of ¹³⁷Cs

A Yunoki1, Y Kawada, T Yamada

  • 1National Metrology Institute of Japan, National Institute of Advanced Industrial Sciences and Technology, Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan. a.yunoki@aist.go.jp

Applied Radiation and Isotopes : Including Data, Instrumentation and Methods for Use in Agriculture, Industry and Medicine
|May 11, 2013
PubMed

Keywords:
(137)CsBackscatterCounting efficiencyInternal conversion electronse-X coincidence technique

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