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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Nandan Satapathy1, Deepak Pandey, Sourish Banerjee
1Raman Research Institute, Sadashiva Nagar, Bangalore 560080, India. nandan.s@gmail.com
Researchers digitally controlled light phase using acousto-optic interaction, engineering optical phase noise. This technique enables tailored dephasing for optical networks and reveals photon bunching in interferometer dark ports.
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