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Updated: May 10, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Lingfeng Chen1, Xiaofei Guo, Jinjian Hao
1School of Optoelectronics, Beijing Institute of Technology, Beijing, China. djkclf@bit.edu.cn
This study introduces a new refractive index measurement technique using longitudinal displacement of a point light source (PLS). The method achieves high accuracy (10^-4) for solid and liquid samples.
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