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Updated: May 10, 2026

On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature
Published on: March 11, 2022
Integrated nonlinear optical imaging microscope for on-axis crystal detection and centering at a synchrotron beamline
Jeremy T Madden1, Scott J Toth, Christopher M Dettmar
1Department of Chemistry, Purdue University, 560 Oval Drive, West Lafayette, IN 47906, USA.
This study integrates nonlinear optical (NLO) microscopy with synchrotron X-ray diffraction (XRD) for faster, automated crystal analysis. This combined approach significantly reduces crystal identification time, improving efficiency for structural biology research.
Area of Science:
- Crystallography
- Biophysics
- Microscopy
Background:
- Synchrotron X-ray diffraction (XRD) is crucial for protein structure determination.
- Automated crystal centering and identification are bottlenecks in XRD workflows.
- Nonlinear optical (NLO) techniques offer rapid, non-destructive sample analysis.
Purpose of the Study:
- To integrate NLO microscopy with synchrotron XRD on a single platform.
- To develop and evaluate NLO methods for rapid protein crystal detection and centering.
- To assess the performance of NLO-XRD integration for various crystalline and non-crystalline samples.
Main Methods:
- Developed two NLO optical designs (downstream and upstream) for integration with a diffractometer.
- Employed second-harmonic-generation (SHG) and two-photon-excited ultraviolet fluorescence microscopy.
- Evaluated crystal detection and centering using X-ray raster scanning for comparison.
- Analyzed protein crystals (cPAH, TsUCH37, kOR-T4L, intimin) and α-cellulose samples.
Main Results:
- Achieved protein crystal identification with per-pixel integration times of 80–150 µs.
- Demonstrated a ∼10^3–10^4-fold reduction in exposure time compared to XRD raster scanning.
- Successfully performed quantitative centering and analysis of multiple protein samples and α-cellulose.
- Observed good agreement between NLO and XRD measurements for sample positioning.
Conclusions:
- NLO instrumentation integrated with synchrotron XRD enables rapid, automated crystal analysis.
- The combined platform significantly accelerates sample characterization workflows.
- This integrated approach is effective for diverse crystalline and fiber diffraction samples.
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