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Related Concept Videos

X-ray Imaging01:24

X-ray Imaging

German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with X-rays, and by 1900, X-ray was widely...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

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Related Experiment Video

Updated: May 10, 2026

X-ray Dose Reduction through Adaptive Exposure in Fluoroscopic Imaging
08:30

X-ray Dose Reduction through Adaptive Exposure in Fluoroscopic Imaging

Published on: September 11, 2011

In situ X-ray beam imaging using an off-axis magnifying coded aperture camera system.

Anton Kachatkou1, Nicholas Kyele, Peter Scott

  • 1School of Electrical and Electronic Engineering, The University of Manchester, Sackville Street Building, Manchester M13 9PL, UK. anton.kachatkou@manchester.ac.uk

Journal of Synchrotron Radiation
|June 15, 2013
PubMed
Summary

This study introduces a novel transparent X-ray beam imaging system. The developed instrument accurately measures X-ray beam profiles without direct exposure, achieving comparable image quality to traditional methods.

Keywords:
X-ray imagingbeam diagnosticsdeconvolutionpinhole camerascattering measurements

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Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography
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Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography

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Last Updated: May 10, 2026

X-ray Dose Reduction through Adaptive Exposure in Fluoroscopic Imaging
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X-ray Dose Reduction through Adaptive Exposure in Fluoroscopic Imaging

Published on: September 11, 2011

Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography
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Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography

Published on: February 21, 2017

Area of Science:

  • Optics and Imaging
  • Particle Beam Instrumentation
  • Synchrotron Radiation Science

Background:

  • Accurate characterization of X-ray beams is crucial for experiments.
  • Traditional X-ray imaging often requires direct beam exposure, posing safety and equipment challenges.
  • Developing non-invasive imaging techniques for transparent X-ray beams is an ongoing need.

Purpose of the Study:

  • To present a novel imaging model and image reconstruction algorithm for transparent X-ray beam analysis.
  • To enable precise measurement of X-ray beam profiles without direct beam exposure.
  • To validate the performance of the developed imaging system.

Main Methods:

  • Utilized a coded aperture camera to capture magnified images of the X-ray beam footprint on an angled thin foil.
  • Developed an imaging model treating the instrument as a linear system, accounting for image blur from foil thickness, aperture shape/size, and detector point-spread function.
  • Implemented an image reconstruction algorithm to deblur images and correct for geometrical distortions caused by foil tilt.

Main Results:

  • The imaging model accurately described the instrument's behavior, incorporating various blur sources.
  • The reconstruction algorithm effectively removed image blur and corrected for distortions.
  • Experimental validation at synchrotron radiation beamlines demonstrated high-quality X-ray beam cross-section imaging.
  • Achieved image quality comparable to direct-beam X-ray cameras.

Conclusions:

  • The proposed transparent X-ray beam imaging system offers a viable alternative to direct-beam methods.
  • The developed imaging model and reconstruction algorithm provide accurate characterization of X-ray beams.
  • This technology has significant potential for applications where direct beam exposure is undesirable or impossible.