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Related Concept Videos

X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Related Experiment Video

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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Digital electron diffraction--seeing the whole picture.

Richard Beanland1, Paul J Thomas, David I Woodward

  • 1Department of Physics, University of Warwick, Coventry CV4 7AL, England. r.beanland@warwick.ac.uk

Acta Crystallographica. Section A, Foundations of Crystallography
|June 20, 2013
PubMed
Summary
This summary is machine-generated.

This study introduces a computer-controlled electron diffraction technique for precise nanomaterial symmetry determination. It overcomes previous angular limitations, enhancing data interpretation and applicability for various materials.

Keywords:
CBEDLACBEDcomputer controlelectron diffractionsymmetry determination

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Last Updated: May 10, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
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Published on: April 1, 2017

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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Convergent-beam electron diffraction (CBED) is valuable for nanoscale symmetry determination.
  • Traditional CBED is limited by small Bragg angles, causing overlapping diffraction patterns with high beam convergence.
  • Existing methods involve trade-offs between illuminated area and beam convergence.

Purpose of the Study:

  • To present a novel, computer-controlled technique for overcoming angular limitations in CBED.
  • To enable electron diffraction data collection over a wide angular range from nanoscale volumes.
  • To improve the ease of interpretation and broaden the application of CBED.

Main Methods:

  • Utilizing computer control to manage electron beam convergence and angular range.
  • Acquiring diffraction data from focused electron beams (few nm or less).
  • Collecting data across a large angular range for multiple diffracted beams.

Main Results:

  • The technique successfully overcomes angular restrictions in CBED.
  • Obtained diffraction data covers a significantly larger angular range.
  • Increased data quantity enhances interpretation and expands applicability.

Conclusions:

  • The described computer-controlled CBED technique offers a simple yet powerful solution to existing limitations.
  • It provides richer diffraction information, improving symmetry determination for nanoscale materials.
  • The method is particularly beneficial for analyzing thin films and materials with large lattice parameters.