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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which are...

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Updated: May 10, 2026

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
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High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

High speed atomic force microscopy enabled by a sample profile estimator.

Peng Huang1, Sean B Andersson

  • 1Department of Mechanical Engineering, Boston University, Boston, Massachusetts 02215, USA.

Applied Physics Letters
|July 5, 2013
PubMed
Summary
This summary is machine-generated.

This study introduces an estimation scheme for Atomic Force Microscopy (AFM) enabling high-speed imaging beyond instrument bandwidth. The method significantly improves imaging rates on standard equipment with minimal hardware changes.

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Area of Science:

  • Surface Science
  • Nanotechnology
  • Microscopy

Background:

  • Atomic Force Microscopy (AFM) is crucial for nanoscale imaging.
  • Conventional AFM imaging rates are limited by vertical positioner bandwidth.
  • High-speed AFM is desirable for dynamic processes and large-area scans.

Purpose of the Study:

  • To present an estimation scheme for enhancing AFM imaging rates.
  • To enable high-speed AFM on typical commercial instruments.
  • To demonstrate the effectiveness of the proposed estimation method.

Main Methods:

  • Development of an estimation scheme for AFM imaging.
  • Application of the estimator to existing commercial AFM instruments.
  • Minimal hardware modification required, focusing on cantilever signal sampling.

Main Results:

  • Achieved imaging rates significantly exceeding the vertical positioner's bandwidth.
  • Demonstrated an order-of-magnitude improvement in imaging rate.
  • Validated the method through experiments on a calibration sample and lambda DNA.

Conclusions:

  • The proposed estimation scheme effectively enhances AFM imaging speed.
  • The method is applicable to existing instruments with minor modifications.
  • High-speed AFM imaging is achievable on standard commercial platforms.