Jove
Visualize
Contact Us

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Mechano-mechanical parametric coupling in MEMS between GHz and kHz frequency regimes at room temperature.

Microsystems & nanoengineering·2026
Same author

Low-temperature AFM with a microwave cavity optomechanical transducer.

Beilstein journal of nanotechnology·2025
Same author

Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications.

Beilstein journal of nanotechnology·2024
Same author

Multipartite Entanglement in a Microwave Frequency Comb.

Physical review letters·2023
Same author

Intermodal coupling spectroscopy of mechanical modes in microcantilevers.

Beilstein journal of nanotechnology·2023
Same author

Measurement and control of a superconducting quantum processor with a fully integrated radio-frequency system on a chip.

The Review of scientific instruments·2022
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: May 9, 2026

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope
06:45

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

Published on: February 28, 2019

Polynomial force approximations and multifrequency atomic force microscopy.

Daniel Platz1, Daniel Forchheimer, Erik A Tholén

  • 1KTH Royal Institute of Technology, Section for Nanostructure Physics, Albanova University Center, SE-106 91 Stockholm, Sweden.

Beilstein Journal of Nanotechnology
|July 12, 2013
PubMed
Summary
This summary is machine-generated.

We developed polynomial force reconstruction using intermodulation atomic force microscopy (ImAFM) data to map polymer blend surfaces. This method accurately determines tip-surface forces, offering high-resolution surface-property insights.

Keywords:
AFMatomic force microscopyforce spectroscopyintermodulationmultifrequencypolynomial

More Related Videos

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Related Experiment Videos

Last Updated: May 9, 2026

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope
06:45

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

Published on: February 28, 2019

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Area of Science:

  • Materials Science
  • Surface Science
  • Analytical Chemistry

Background:

  • Atomic Force Microscopy (AFM) is crucial for nanoscale surface analysis.
  • Intermodulation AFM (ImAFM) provides rich data on tip-surface interactions.
  • Accurate force reconstruction is essential for interpreting AFM measurements.

Purpose of the Study:

  • To present a novel polynomial force reconstruction method for ImAFM data.
  • To compare this method with Amplitude-Dependence Force Spectroscopy (ADFS).
  • To generate high-resolution surface-property maps of polymer blends.

Main Methods:

  • Polynomial force reconstruction applied to experimental ImAFM data.
  • Analysis of tip-surface forces during slow surface approach.
  • Comparison with established ADFS techniques.
  • Adaptation of the approximative force reconstruction approach to a force quadrature picture.

Main Results:

  • Successful polynomial force reconstruction from ImAFM data.
  • High-resolution surface-property maps generated for polymer blend samples.
  • Demonstration of the method's applicability beyond spectral data.
  • Validation of the approximative force reconstruction framework.

Conclusions:

  • Polynomial force reconstruction is an effective method for analyzing ImAFM data.
  • The developed technique enables precise characterization of polymer blend surfaces.
  • The general approximative force reconstruction framework offers broad applicability in AFM analysis.