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Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
09:01

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Published on: April 16, 2017

Improved controlled atmosphere high temperature scanning probe microscope.

K V Hansen1, Y Wu, T Jacobsen

  • 1Department of Energy Conversion and Storage, Technical University of Denmark, DTU Risø Campus, Frederiksborgvej 399, DK-4000 Roskilde, Denmark.

The Review of Scientific Instruments
|August 2, 2013
PubMed
Summary
This summary is machine-generated.

Advanced scanning probe microscopy allows high-temperature, in-situ analysis of functional materials under reactive gases. This enables a deeper understanding of electrochemical processes crucial for energy technologies like fuel cells.

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Area of Science:

  • Materials Science
  • Electrochemistry
  • Surface Science

Background:

  • Understanding functional materials at the nanoscale under operating conditions is vital for energy technologies.
  • High temperatures and reactive gas environments present significant challenges for in-situ analysis.

Purpose of the Study:

  • To present advancements in controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM).
  • To enable sub-micron scale, operando analysis of material surfaces and interfaces under gas atmospheres.

Main Methods:

  • Utilized an improved CAHT-SPM capable of various scanning probe techniques (tapping mode, STM, STS, conductive AFM, KPFM).
  • Operated at sample temperatures up to 850°C with controlled introduction of oxidizing/reducing gases (O2, H2, N2).
  • Integrated in-situ monitoring of oxygen partial pressure (pO2).

Main Results:

  • Demonstrated high-temperature topography with simultaneous AC electrical conductance measurements during atmosphere changes.
  • Performed electrochemical impedance spectroscopy at various temperatures.
  • Measured surface potential changes under varying conditions.

Conclusions:

  • The enhanced CAHT-SPM provides powerful capabilities for local, sub-micron analysis.
  • It facilitates the study of high-temperature and gas-induced material changes.
  • This technique holds significant potential for advancing research in energy materials and devices.