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Colorimetric sensors using nano-patch surface plasmon resonators.

Mohammadreza Khorasaninejad¹, S Mohsen Raeis-Zadeh, Hadi Amarloo

¹Department of Electrical and Computer Engineering, and Waterloo Institute of Nanotechnology, University of Waterloo, 200 University Avenue West, Waterloo, ON N2L 3G1, Canada. mkhorasa@uwaterloo.ca

|August 7, 2013

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This study introduces a novel refractive index sensor using gold nano-patches. The sensor achieves high resolution for detecting changes in surrounding materials, demonstrated by silicon dioxide deposition.

Area of Science:

Nanophotonics
Plasmonics
Optical Sensing

Background:

Localized surface plasmon resonances (LSPRs) are sensitive to the surrounding refractive index.
Colorimetric sensing offers a simple and potentially low-cost approach for material detection.

Purpose of the Study:

To propose and demonstrate a refractive index sensor based on gold nano-patches and LSPR.
To achieve high refractive index resolution using visible reflectance spectra and image processing.
To evaluate the sensor's capability for surface analysis through thin film deposition.

Main Methods:

Fabrication of a 2D array of gold nano-patches on a highly reflective mirror.
Excitation of LSPRs via a grating structure, leading to reflectance minima.
Tuning of resonance wavelength by adjusting nano-patch width.

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Measurement of color variations in reflected light due to refractive index changes.

Application of image processing for quantitative analysis and surface sensing.

Main Results:

Achieved a refractive index resolution better than 10⁻⁵.
Demonstrated color variation detectable by the naked eye upon deposition of a 3 nm silicon dioxide layer.
Resolved deposition thicknesses as small as 2 Å using image processing.
The resonance wavelength is tunable and dependent on nano-patch dimensions and medium's refractive index.

Conclusions:

The proposed gold nano-patch array serves as a simple, low-cost, and highly sensitive refractive index sensor.
The sensor is effective for both bulk refractive index measurements and surface analysis, including thin film detection.
Image processing of reflected colors provides a powerful tool for quantitative sensing with high resolution.