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Updated: May 9, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Analytical electron microscopy of W-core β-SiC fibers for use in an SiC-based composite material for fusion
Tea Toplišek1, Medeja Gec, Aljaž Iveković
1Jozef Stefan Institute, Department for Nanostructured Materials, Jamova cesta 39, SI-1000 Ljubljana, Slovenia.
Abstract:
In this work, the interactions between tungsten (W) and silicon carbide (SiC) in Sigma SiC fibers at high temperatures were characterized using scanning and transmission electron microscopy. These fibers could have the potential for use in fusion-related applications owing to their high thermal conductivity compared with pure SiC-based fibers. The as-received fibers were composed of a 100-μm-thick shell of radially textured β-SiC grains and a 15-μm-thick tungsten core, composed of a few hundreds of nm-sized elongated tungsten grains. The interfaces between the tungsten and the SiC and the SiC and the outer coatings were sharp and smooth. After heat treatment at 1,600°C for 3 h in Ar, the tungsten core reacted with SiC to form a rough interface surface. Inside the core, W₅Si₃, W₃Si, and W₂C phases were detected using energy-dispersive X-ray spectroscopy and electron-diffraction techniques. The mechanical properties of the fibers deteriorate after the heat treatment.
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