Multi-element analysis by portable total reflection X-ray fluorescence spectrometer.

Ying Liu1, Susumu Imashuku, Jun Kawai

  • 1Department of Materials Science and Engineering, Kyoto University, Sakyo, Kyoto 606-8501, Japan. liu.ying.48r@st.kyoto-u.ac.jp

Summary

A portable total reflection X-ray fluorescence (TXRF) spectrometer was optimized for multi-element analysis. This method achieved sub-nanogram detection limits for nine elements in just 10 minutes.

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