Dual-detection confocal fluorescence microscopy: fluorescence axial imaging without axial scanning

Dong-Ryoung Lee1, Young-Duk Kim, Dae-Gab Gweon

  • 1Nano Opto-Mechatronics Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 305-701, South Korea.

Optics Express
|August 14, 2013
PubMed
Summary

We developed dual-detection confocal fluorescence microscopy (DDCFM) for fast 3-D imaging. This method obtains depth information without scanning, reducing phototoxicity and photobleaching for improved fluorescence microscopy.

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