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Updated: May 8, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Applicability analysis of wavelet-transform profilometry.

Zibang Zhang1, Jingang Zhong

  • 1Department of Optoelectronic Engineering, Jinan University, 510632 Guangzhou, China.

Optics Express
|August 14, 2013
PubMed
Summary
This summary is machine-generated.

Wavelet-transform profilometry accuracy improves by increasing carrier fringe frequency. This enhances local linearity for more robust phase demodulation in surface measurements.

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Area of Science:

  • Optics and Photonics
  • Metrology
  • Signal Processing

Background:

  • Wavelet-transform profilometry is a technique for measuring surface topography.
  • Phase demodulation accuracy is crucial for reliable measurements.
  • Current applicability conditions for wavelet-transform profilometry are limited.

Purpose of the Study:

  • To investigate the applicability of wavelet-transform profilometry.
  • To establish a more robust condition for its application.
  • To propose a method for improving measurement accuracy.

Main Methods:

  • Examining wavelet-ridge-based phase demodulation.
  • Evaluating the local linearity of the phase modulated by the object surface.
  • Conducting numerical simulations and experimental validation.

Main Results:

  • Applicability is directly related to the local linearity of the phase.
  • Increasing carrier fringe frequency enhances local linearity.
  • Higher carrier fringe frequency improves phase demodulation and measurement accuracy.

Conclusions:

  • The proposed method of increasing carrier fringe frequency enhances wavelet-transform profilometry applicability.
  • This approach offers improved measurement accuracy for surface topography.
  • The findings provide a more robust condition for applying wavelet-transform profilometry.