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Use of in situ atomic force microscopy to follow phase changes at crystal surfaces in real time

Ranjit Thakuria1, Mark D Eddleston, Ernest H H Chow

  • 1Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB2 1EW (UK); Department of Chemical Sciences, Tezpur University, Napaam, Tezpur-784 028, Assam (India).

Angewandte Chemie (International Ed. in English)
|August 20, 2013
PubMed

Keywords:
atomic force microscopycocrystalsphase transitionspolymorphismsurface analysis

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...