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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Related Experiment Video

Updated: May 8, 2026

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
07:12

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics

Published on: August 28, 2018

Diagnosing nanoelectronic components using coherent electrons.

Kai He1, John Cumings

  • 1Department of Materials Science and Engineering, University of Maryland , College Park, Maryland 20742, United States.

Nano Letters
|August 28, 2013
PubMed
Summary
This summary is machine-generated.

Directly observing electric potential around carbon nanotubes using electron holography (EH) reveals contact resistance variations. This technique precisely diagnoses nanoscale electronic devices.

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Scanning-probe Single-electron Capacitance Spectroscopy
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Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

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Last Updated: May 8, 2026

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
07:12

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics

Published on: August 28, 2018

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Nanotechnology

Background:

  • Understanding electrical properties of carbon nanotubes (CNTs) is crucial for nanoelectronic devices.
  • Characterizing contact resistance at the metal-nanotube interface is a key challenge.

Purpose of the Study:

  • To directly observe the electric potential distribution around a single CNT under electrical bias.
  • To differentiate potential drops at the metal-CNT interface from those along the CNT.
  • To identify and quantify the impact of contact resistivity on potential distribution.

Main Methods:

  • Off-axis electron holography (EH) for direct potential mapping.
  • Finite element modeling (FEM) to interpret EH data.
  • Electrical biasing of a single CNT with two contacts.

Main Results:

  • EH successfully visualized the electrostatic potential distribution near the biased CNT.
  • The method allowed separation of potential drops across contacts and along the CNT.
  • Asymmetric EH phase shifts correlated with uneven contact resistivity were observed and quantified.

Conclusions:

  • Electron holography provides a precise method for analyzing potential distribution in nanoscale devices.
  • EH enables detailed understanding and rapid diagnosis of contact properties in CNT-based electronics.
  • This technique is applicable to a wide range of similar nanoscale electronic systems.