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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

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Low-voltage electron-probe microanalysis of Fe-Si compounds using soft X-rays.

Phillip Gopon1, John Fournelle, Peter E Sobol

  • 1Department of Geoscience, University of Wisconsin, Madison, WI 53706, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|August 30, 2013
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Summary

Analyzing small iron-silicon compounds requires advanced electron-probe microanalysis techniques. This study explores alternative X-ray lines for precise analysis of sub-micron samples, overcoming limitations of conventional methods.

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Area of Science:

  • Geochemistry
  • Materials Science
  • Analytical Chemistry

Background:

  • Conventional electron-probe microanalysis (EPMA) offers limited spatial resolution (1-4 μm).
  • Many naturally occurring iron-silicon (Fe-Si) compounds are smaller than 1 μm.
  • Analysis of these sub-micron Fe-Si compounds necessitates lower accelerating potentials and non-standard X-ray lines.

Purpose of the Study:

  • To address challenges in quantitative analysis of sub-micron Fe-Si compounds using EPMA.
  • To review and discuss alternative X-ray lines for iron analysis below 5 keV.
  • To evaluate the feasibility of using Fe Lβ, and Fe Ll-η lines for analyzing small Fe-Si samples.

Main Methods:

  • Investigated the use of lower accelerating potentials for EPMA.
  • Examined the application of non-standard X-ray lines for iron analysis.
  • Discussed limitations of soft X-ray lines (e.g., Fe Lα) for quantitative analysis.
  • Reviewed alternative X-ray lines (Fe Lβ, Fe Ll-η) for iron analysis at <5 keV.

Main Results:

  • Identified challenges with soft X-rays, including surface effects, peak shifts, and uncertainties in mass attenuation coefficients.
  • Highlighted issues with spectral resolution and count rates for conventional methods.
  • Demonstrated the potential of alternative X-ray lines for analyzing sub-micron Fe-Si compounds.

Conclusions:

  • Conventional EPMA struggles with sub-micron Fe-Si compounds due to resolution limits.
  • Alternative X-ray lines (Fe Lβ, Fe Ll-η) offer viable solutions for analyzing small Fe-Si samples.
  • Careful selection of X-ray lines is crucial for accurate quantitative analysis in micro-scale materials.