Quantitative EDXS analysis of organic materials using the ζ-factor method.

Area of Science:

• Materials Science
• Analytical Chemistry
• Physics

Background:

• Quantitative X-ray analysis of organic thin films, especially those with light elements, faces challenges due to X-ray absorption.
• Conventional techniques often struggle with accuracy when quantifying light elements.

Purpose of the Study:

• To apply and validate the ζ-factor method for quantitative X-ray analysis of organic thin films containing light elements.
• To demonstrate the method's superiority over conventional techniques in accuracy and quality of results.

Main Methods:

• Detailed description of determining sensitivity factors (ζ-factors) using a single standard specimen.
• Parameter optimization for estimating ζ-factors for elements absent in the standard.
• Application of the ζ-factor method to organic semiconducting materials.

Main Results:

• Successful application of the ζ-factor method for quantitative X-ray analysis.
• Significant improvement in quantification quality and accuracy, particularly for light elements.
• Demonstrated intrinsic correction for X-ray absorption.

Conclusions:

• The ζ-factor method is a robust and accurate approach for quantitative X-ray analysis of organic thin films.
• This method overcomes limitations of conventional techniques, especially for light element quantification.
• Verified results confirm the method's validity and accuracy for organic electronics applications.