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Ultramicroscopy|September 10, 2013
Quantitative EDXS analysis of organic materials using the ζ-factor methodStefanie Fladischer, Werner GroggerACS Applied Materials & Interfaces|October 3, 2012
Diffusion of Ag into organic semiconducting materials: a combined analytical study using transmission electron microscopy and X-ray reflectivityStefanie Fladischer, Alfred Neuhold, Elke Kraker, et al.Micron (Oxford, England : 1993)|April 16, 2003
Width determination of SiO2-films in Si-based devices using low-loss EFTEM: image contrast as a function of sample thicknessBernhard Schaffer, Werner Grogger, Ferdinand HoferUltramicroscopy|November 24, 2004
Automated spatial drift correction for EFTEM image seriesBernhard Schaffer, Werner Grogger, Gerald KothleitnerUltramicroscopy|July 29, 2006
EFTEM spectrum imaging at high-energy resolutionBernhard Schaffer, Gerald Kothleitner, Werner GroggerMicron (Oxford, England : 1993)|March 24, 2006
Electron-irradiation damage in chromium nitrides and chromium oxynitride thin filmsChristoph Mitterbauer, Werner Grogger, Peter Wilhartitz, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2014
Linking TEM analytical spectroscopies for an assumptionless compositional analysisGerald Kothleitner, Werner Grogger, Martina Dienstleder, et al.Analytical and Bioanalytical Chemistry|September 18, 2007
Application of high-resolution EFTEM SI in an AEMBernhard Schaffer, Werner Grogger, Gerald Kothleitner, et al.Ultramicroscopy|July 23, 2003
Energy-filtering TEM at high magnification: spatial resolution and detection limitsWerner Grogger, Bernhard Schaffer, Kannan M Krishnan, et al.Micron (Oxford, England : 1993)|January 5, 2005
Advantages of a monochromator for bandgap measurements using electron energy-loss spectroscopyKoji Kimoto, Gerald Kothleitner, Werner Grogger, et al.Pageof 3