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Currents induced by injected charge in junction detectors

Eugenijus Gaubas1, Tomas Ceponis, Vidas Kalesinskas

  • 1Institute of Applied Research, Vilnius University, Sauletekio av. 9-III, LT-10223, Vilnius, Lithuania. eugenijus.gaubas@ff.vu.lt.

Sensors (Basel, Switzerland)
|September 17, 2013
PubMed
Summary

This study analyzes drifting charge-induced currents to predict performance in photo- and particle-detectors. It reveals how carrier behavior influences current pulse shapes, crucial for detector design.

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