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Updated: May 7, 2026

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
Published on: June 30, 2023
David Alsteens1, Audrey Beaussart, Sofiane El-Kirat-Chatel
1Université catholique de Louvain, Institute of Life Sciences, Croix du Sud, 1, Louvain-la-Neuve, Belgium.
No abstract available in PubMed .