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Elemental analysis of white electrical tapes by wavelength dispersive X-ray fluorescence spectrometry

Zhenwen Sun1, Yangke Quan, Yuyou Sun

  • 1Institute of Forensic Science, Ministry of Public Security, Muxidi South 17#, Xicheng District, Beijing, China.

Forensic Science International
|September 24, 2013
PubMed

Keywords:
BackingDiscriminating powerElectrical tapeElemental compositionForensic scienceX-ray fluorescence spectrometry

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