Related Experiment Video
Updated: May 7, 2026

09:43
Transmission of Multiple Signals through an Optical Fiber Using Wavefront Shaping
Published on: March 20, 2017
[Optical path difference in off-plane quasi-Littrow dispersion mountings]
Yin-Xin Zhang1, Huai-Dong Yang, Zhan-Hua Huang
1College of Precision Instrument and Opto-electronics Engineering, Key Laboratory of Opto-electronics Information Technology of the Ministry of Education, Tianjin University, Tianjin 300072, China. yinxin@tju.edu.cn
Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu
|September 25, 2013
Summary
This study reveals that off-plane angles in quasi-Littrow dispersion mountings cause beam rotation, affecting optical path difference calculations. A new directional derivative method accurately computes optical path differences for spherical mirrors in these systems.
Area of Science:
- Optics and Photonics
- Spectroscopy
- Optical Engineering
Context:
- Off-plane quasi-Littrow (OP-QL) dispersion mountings are utilized in various spectroscopic instruments.
- Accurate calculation of optical path difference (OPD) is crucial for performance optimization.
- Existing methods may not fully account for the complexities introduced by off-plane configurations.
Purpose:
- To analyze the relationship between meridian and sagittal rays in OP-QL mountings.
- To develop a novel method for calculating OPD in OP-QL systems.
- To validate the proposed methodology with practical examples.
Summary:
- The off-plane angle in OP-QL mountings induces beam rotation, leading to sagittal beam mismatch across optical elements.
- The total optical path difference (OPD) must be an accumulation of corresponding beams, not just individual sagittal beams.
- A directional derivative-based method is introduced for calculating OPD for spherical mirrors in diverse directions within OP-QL configurations.
Impact:
- Provides a more accurate method for calculating optical path difference in off-plane optical systems.
- Enables improved design and performance of spectrometers and other optical instruments using OP-QL mountings.
- Validates the new methodology using echelette and echelle gratings, demonstrating its practical applicability.

