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Picometer-Precision Atomic Position Tracking through Electron Microscopy

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Published on: July 3, 2021

Local crystallography analysis for atomically resolved scanning tunneling microscopy images.

Wenzhi Lin¹, Qing Li, Alexei Belianinov

¹Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.

|September 25, 2013

Summary

This study introduces an iterative algorithm for analyzing scanning probe microscopy data, enabling quantitative assessment of atomic positions and local properties on inhomogeneous surfaces.

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Area of Science:

Surface Science
Materials Science
Nanotechnology

Background:

Scanning probe microscopy (SPM) provides atomically resolved surface imaging.
Qualitative and semi-quantitative interpretations often limit SPM data analysis.
Local atomic parameters offer insights into chemical bonding and order fields.

Purpose of the Study:

To develop an iterative algorithm for precise atomic position determination in SPM images.
To enable quantitative analysis of inhomogeneous surfaces.
To extract and quantify local properties from SPM data.

Main Methods:

Development of an iterative algorithm for atomic indexing and position determination.
Application of the algorithm to analyze local crystallographic properties.
Testing the approach on real surfaces like graphite and Fe-based superconductors.

Main Results:

Demonstration of an iterative algorithm for quantitative SPM data analysis.
Successful local crystallographic analysis of inhomogeneous surfaces.
Extraction of quantifiable local atomic parameters.

Conclusions:

The developed algorithm provides a new pathway for quantitative analysis of SPM images.
Enables deeper understanding of local chemical bonding and order parameters.
Advances the interpretation of SPM data for materials characterization.