Avoiding the pitfalls of single particle cryo-electron microscopy: Einstein from noise

Richard Henderson1

  • 1Medical Research Council Laboratory of Molecular Biology, Cambridge CB2 0QH, United Kingdom.

Summary

Researchers using single particle cryo-electron microscopy (cryo-EM) must beware of "Einstein from noise." This common pitfall leads to false particle identification, generating inaccurate 3D maps from noise, especially for smaller biological structures.