Atomic Force Microscopy
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Updated: May 7, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
1The Photophysics Research Group, Department of Physics, Centre for Molecular Nanometrology, SUPA, University of Strathclyde, Glasgow, Scotland, UK.
This study presents a fluorescence metrology method to measure average nanoparticle size (1-10 nm) by analyzing Brownian rotation. The technique uses the Stokes-Einstein equation for accurate nanoparticle sizing.
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