Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

IR Spectrometers01:25

IR Spectrometers

3.1K
There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
3.1K
Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

776
Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over...
776

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Dynamic range enhancement of the roll angle displacement measurement with birefringence using a polarization camera.

Applied optics·2021
Same author

Measurement of the refractive index of lenses from the maximum phase difference of the total internal reflection with a polarization camera.

Applied optics·2021
Same author

Standing-wave interferometer based on single-layer SiO<sub>2</sub> nano-sphere scattering.

Optics express·2017
Same author

Development of an angular displacement measurement technique through birefringence heterodyne interferometry.

Optics express·2016
Same author

Heterodyne common-path grating interferometer with Littrow configuration.

Optics express·2013
Same author

Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry.

Applied optics·2012
Same journal

Denoising algorithm of Φ-OTDR systems based on adaptive fractional wavelet transform denoising.

Optics express·2026
Same journal

Millisecond photon-to-photon latency and high-speed volumetric projection system for optogenetics.

Optics express·2026
Same journal

Polarization-encoded coaxial structured light for high-precision 3D surface profilometry.

Optics express·2026
Same journal

Discrete freeform optical design based on collaborative optimization of point cloud and local normals.

Optics express·2026
Same journal

Ultrafast ghost imaging with 25 GHz speckle switching and wavelength-division multiplexing.

Optics express·2026
Same journal

Atomic vapor cells fabricated by femtosecond laser welding of standard-optical-quality glass.

Optics express·2026
See all related articles

Related Experiment Video

Updated: May 6, 2026

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
08:23

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

Published on: September 30, 2019

5.5K

Displacement measurement using a wavelength-phase-shifting grating interferometer.

Ju-Yi Lee, Geng-An Jiang

    Optics Express
    |October 24, 2013
    PubMed
    Summary
    This summary is machine-generated.

    A new grating interferometer uses wavelength-modulated phase shifting for precise displacement measurements. This method achieves nanometer-level accuracy over large distances, enhancing optical metrology applications.

    More Related Videos

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
    10:39

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

    Published on: October 11, 2016

    9.1K
    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    8.8K

    Related Experiment Videos

    Last Updated: May 6, 2026

    A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
    08:23

    A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

    Published on: September 30, 2019

    5.5K
    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
    10:39

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

    Published on: October 11, 2016

    9.1K
    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    8.8K

    Area of Science:

    • Optics and Metrology
    • Interferometry
    • Nanotechnology

    Background:

    • Accurate displacement measurement is crucial in various scientific and industrial fields.
    • Traditional interferometry methods face limitations in range and precision.
    • Grating interferometry offers a robust platform for high-resolution measurements.

    Purpose of the Study:

    • To propose a novel grating interferometer system for displacement measurements.
    • To implement a wavelength-modulated phase-shifting technique for enhanced accuracy.
    • To validate the system's performance for both large-scale and nanoscale displacement detection.

    Main Methods:

    • Development of a grating interferometer utilizing a wavelength-modulated laser source.
    • Application of sequential phase shifting through an unequal-path-length optical configuration.
    • Employing time-domain quadrature detection to measure the optical phase of a moving grating.

    Main Results:

    • The proposed method successfully measures grating displacement using phase variation.
    • Experimental validation demonstrates detection of displacements up to 1 mm.
    • The system achieves displacement variation detection down to the nanometer range.

    Conclusions:

    • The wavelength-modulated phase-shifting grating interferometer is a viable technique for high-precision displacement sensing.
    • This method offers a significant advancement in optical metrology, enabling measurements over extended ranges with sub-nanometer resolution.
    • The developed system has potential applications in precision engineering, semiconductor manufacturing, and scientific instrumentation.