Characterization of individual nano-objects with nanoprojectile-SIMS

C-K Liang1, S V Verkhoturov, Y Bisrat

  • 1Department of Chemistry, Texas A&M University, College Station, TX, 77843-3255, USA.

Surface and Interface Analysis : SIA
|October 29, 2013
PubMed
Summary

Secondary ion mass spectrometry (SIMS) enables individual nano-object characterization by analyzing them one-by-one. A Nano-Assisted Laser Desorption/Ionization (NALDI™) plate effectively isolates these nano-objects for precise compositional analysis.

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