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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
1Department of Electrical Engineering, Columbia University, New York, NY 10027, USA.
Researchers developed a new edge-contact method for two-dimensional (2D) materials, improving electrical contact in graphene heterostructures for advanced electronic devices.
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