Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.1K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.1K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

One-Pot Tandem Construction of Isoindolinone Derivatives under Visible-Light Photoredox Catalysis.

ACS omega·2026
Same author

Lipid Metabolic Disorders: a Pivotal Driver in Type 2 Diabetes Mellitus Pathogenesis.

Current obesity reports·2026
Same author

Diagnosis and treatment of neurofibromatosis type 1 with malignant transformation and multiple gastrointestinal stromal tumors: a case report and literature review.

Frontiers in medicine·2026
Same author

Clinical characterization and developmental follow-up of a child with Sotos syndrome carrying a novel NSD1 variant.

BMC pediatrics·2026
Same author

Enhancing Early Prediction of Gestational Diabetes Mellitus Through Data Augmentation and Feature Guidance: Model Development and Validation Study.

JMIR medical informatics·2026
Same author

Sperm DNA Fragmentation Testing in the Era of Assisted Reproduction: Clinical Utility, Thresholds, and Management Strategies.

Archivos espanoles de urologia·2026

Related Experiment Video

Updated: May 6, 2026

Covalent Immobilization of Proteins for the Single Molecule Force Spectroscopy
11:13

Covalent Immobilization of Proteins for the Single Molecule Force Spectroscopy

Published on: August 20, 2018

13.5K

AFM lateral force calibration for an integrated probe using a calibration grating.

Huabin Wang1, Michelle L Gee

  • 1School of Chemistry, University of Melbourne, Parkville, Victoria 3010, Australia.

Ultramicroscopy
|November 9, 2013
PubMed
Summary

Accurate atomic force microscopy (AFM) friction measurements are now possible with a refined wedge calibration method. This technique ensures reliable lateral force calibration for studying complex surfaces without compromising accuracy.

Keywords:
Atomic force microscopyCalibrationCalibration gratingFrictionLateral force

More Related Videos

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
12:18

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

4.2K
Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy Conpokal on Live Cells
09:20

Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy Conpokal on Live Cells

Published on: August 11, 2020

6.9K

Related Experiment Videos

Last Updated: May 6, 2026

Covalent Immobilization of Proteins for the Single Molecule Force Spectroscopy
11:13

Covalent Immobilization of Proteins for the Single Molecule Force Spectroscopy

Published on: August 20, 2018

13.5K
Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
12:18

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

4.2K
Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy Conpokal on Live Cells
09:20

Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy Conpokal on Live Cells

Published on: August 11, 2020

6.9K

Area of Science:

  • Surface Science
  • Materials Science
  • Nanotechnology

Background:

  • Accurate friction measurements using atomic force microscopy (AFM) are crucial for understanding material properties.
  • Cantilever calibration for lateral force measurement in AFM is a significant challenge, impacting data reliability.
  • Existing simplified wedge methods often sacrifice accuracy for ease of use.

Purpose of the Study:

  • To develop an improved lateral force calibration method for integrated AFM probes.
  • To enhance the accuracy, reliability, and ease of use of AFM friction measurements.
  • To enable detailed boundary lubrication studies on adhesive and heterogeneous surfaces.

Main Methods:

  • Further development of the established wedge calibration method for AFM.
  • Acquisition of raw friction calibration data through continuous set-point ramping during grating scans.
  • Analysis of scan image data to determine an accurate lateral force conversion factor.

Main Results:

  • A novel, user-friendly lateral force calibration method for AFM probes was successfully developed.
  • The method yields an accurate calibration factor, independent of adhesion forces and load variations.
  • Demonstrated reliability, speed, and ease of execution for the new calibration technique.

Conclusions:

  • The enhanced wedge method provides accurate and reliable lateral force calibration for AFM.
  • This advancement facilitates high-resolution friction studies on challenging adhesive and heterogeneous surfaces.
  • The method supports detailed boundary lubrication investigations requiring precise spatial frictional force resolution.