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Updated: May 6, 2026

Analysis of Volatile and Oxidation Sensitive Compounds Using a Cold Inlet System and Electron Impact Mass Spectrometry
Published on: September 5, 2014
A pulsed-leak valve for use with ion trapping mass spectrometers
C Q Jiao1, D R Ranatunga, W E Vaughn
1H.C. Brown Laboratory of Chemistry, Purdue University, West Lafayette, Indiana, USA.
Abstract:
A pulsed-leak valve that allows the introduction of a prolonged, flat, and controllable pulse of gas is described. Test results from the valve that utilized a Fourier transform ion cyclotron resonance mass spectrometer with Ar and C2H6 as the sample gases indicate that the valve functions as expected and yields basically rectangular pressure profiles in the cell region. The rise and fall times are similar to those of just the stand-alone pulsed valve and are believed to be determined mainly by the design of the vacuum system, rather than the design of the pulsed-leak valve. Kinetic data for the reaction of Nb(+) with C2H6, acquired with the use of the pulsed-leak valve to introduce the C2H6 gas, demonstrates the practical application of this valve for kinetic and other analogous studies. Use of the pulsed-leak valve greatly reduces the loss of the reactant ion signal during the cooling period.
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