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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
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Electrical stress effect on on-current of MILC poly-Si thin-film transistors

Chang Woo Byun1, Se Wan Son, Yong Woo Lee

  • 1Research Institute of Advanced Materials (RIAM), Department of Materials Science and Engineering, Seoul National University, Seoul 151-744, South Korea.

Journal of Nanoscience and Nanotechnology
|November 20, 2013
PubMed

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