Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

3.9K
X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
3.9K
Determination of Crystal Structures01:29

Determination of Crystal Structures

138
In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
138
X-ray Crystallography02:18

X-ray Crystallography

21.6K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
21.6K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Response to Fraser & Wark's comments on A new theory for X-ray diffraction.

Acta crystallographica. Section A, Foundations and advances·2018
Same author

Estimating the structure factors in X-ray diffraction.

Acta crystallographica. Section A, Foundations and advances·2018
Same author

What is an `ideally imperfect' crystal? Is kinematical theory appropriate?

Acta crystallographica. Section A, Foundations and advances·2015
Same author

X-ray investigation of lateral hetero-structures of inversion domains in LiNbO3, KTiOPO4 and KTiOAsO4.

Acta crystallographica. Section A, Foundations and advances·2015
Same author

A new theory for X-ray diffraction.

Acta crystallographica. Section A, Foundations and advances·2014
Same author

High-resolution X-ray diffraction and imaging.

Journal of applied crystallography·2013

Related Experiment Video

Updated: May 5, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

8.3K

A compact high-resolution X-ray powder diffractometer.

Paul F Fewster1, David R D Trout

  • 1PANalytical Research Centre, Sussex Innovation Centre, Falmer, Brighton, East Sussex BN1 9SB, UK.

Journal of Applied Crystallography
|November 28, 2013
PubMed
Summary

A novel powder diffractometer offers rapid phase identification and detailed structural analysis. Its versatile design allows for both compact, fast measurements and high-resolution studies with simplified sample preparation.

Keywords:
high-resolution powder diffactionmonochromatizationtransmission geometry

More Related Videos

High Pressure Single Crystal Diffraction at PX^2
11:32

High Pressure Single Crystal Diffraction at PX^2

Published on: January 16, 2017

22.3K
Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

9.5K

Related Experiment Videos

Last Updated: May 5, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

8.3K
High Pressure Single Crystal Diffraction at PX^2
11:32

High Pressure Single Crystal Diffraction at PX^2

Published on: January 16, 2017

22.3K
Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

9.5K

Area of Science:

  • Materials Science
  • Crystallography
  • Analytical Chemistry

Background:

  • Powder diffractometry is crucial for material characterization.
  • Existing instruments often require complex sample preparation and alignment.
  • There is a need for faster, more versatile powder diffraction methods.

Purpose of the Study:

  • To describe a new powder diffractometer operating in transmission mode.
  • To evaluate its performance in both compact and high-resolution configurations.
  • To demonstrate its suitability for rapid phase identification and detailed structural analysis.

Main Methods:

  • Development of a new powder diffractometer with variable sample-to-detector radius.
  • Utilizing pure Cu Kα1 radiation for incident beam optics.
  • Implementing instantaneous data collection capabilities.

Main Results:

  • Achieved peak widths of ~0.1° in 2θ in compact form (55 mm radius).
  • Improved resolution to <0.05° in 2θ in high-resolution mode (240 mm radius).
  • Demonstrated simplified sample preparation, no sample alignment, and instantaneous data collection.

Conclusions:

  • The new diffractometer offers a versatile solution for rapid phase identification and detailed structural studies.
  • Its design allows for precise resolution calculation and easy analysis of instrumental artifacts.
  • The instantaneous data collection capability opens possibilities for dynamic experiments.