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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: May 5, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

Note: Design and development of an integrated three-dimensional scanner for atomic force microscopy.

T Rashmi¹, G Dharsana, R Sriramshankar

¹Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore 560012, India.

The Review of Scientific Instruments

|December 3, 2013

Summary

A novel compact scanning head for Atomic Force Microscopy (AFM) enhances portability and integration. This 3D scanner, integrated into an AFM micro-probe with magnetic actuation, achieved over 1 μm actuation range on all axes.

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Last Updated: May 5, 2026

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Published on: June 13, 2023

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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

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Published on: October 24, 2014

Area of Science:

Materials Science
Nanotechnology
Mechanical Engineering

Background:

Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging.
Existing AFM systems can be bulky, limiting portability and integration.
A need exists for more compact and versatile AFM scanning solutions.

Purpose of the Study:

To design and develop a compact, integrated three-dimensional (3D) scanner for AFM.
To enhance AFM portability and facilitate integration with other scientific instruments.
To demonstrate the functionality and performance of the novel scanning head.

Main Methods:

A novel AFM micro-probe design incorporating a 3D scanner was developed.
A magnetic actuation system was integrated for precise probe movement.
The scanner, actuation system, and mounts were fabricated and mechanically evaluated.

Main Results:

The integrated 3D scanner successfully operates within the AFM micro-probe.
Experimentally calibrated actuation ranges exceeded 1 micrometer (μm) along all three axes (X, Y, Z).
The compact design demonstrated enhanced portability and potential for tool integration.

Conclusions:

The developed compact scanning head significantly improves AFM portability.
The novel probe design and magnetic actuation enable precise 3D scanning.
This technology facilitates broader applications and integration of AFM in diverse research settings.