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Low energy ion scattering: Determining overlayer thickness for functionalized gold nanoparticles
Ali Rafati1, Rik Ter Veen, David G Castner
1National ESCA and Surface Analysis Center for Biomedical Problems, Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, WA, 98195.
Summary
High sensitivity low energy ion scattering (HS-LEIS) effectively measures self-assembled monolayer (SAM) thickness on gold nanoparticles (AuNPs). This fast, accurate method aids in characterizing nanomaterials for biomedical uses.
Area of Science:
- Nanotechnology
- Surface Science
- Analytical Chemistry
Background:
- Engineered nanoparticles are crucial for biomedical applications.
- Accurate surface characterization is vital for reproducibility and suitability.
- Quantifying self-assembled monolayer (SAM) overlayer thickness provides insight into nanoparticle surface assembly.
Purpose of the Study:
- To introduce and validate high sensitivity low energy ion scattering (HS-LEIS) as a novel method for characterizing SAM thickness on gold nanoparticles (AuNPs).
- To assess the completeness and thickness of SAMs on AuNPs using HS-LEIS.
- To compare HS-LEIS results with established surface analysis techniques.
Main Methods:
- Utilized high sensitivity low energy ion scattering (HS-LEIS) for surface analysis.
- Employed 16-mercaptohexadecanoic acid (C16COOH) to form SAMs on 14 nm AuNPs.
- Compared HS-LEIS data with simulated electron spectra for surface analysis (SESSA) of X-ray photoelectron spectroscopy (XPS) data.
Main Results:
- HS-LEIS confirmed the formation of a complete SAM on C16COOH functionalized AuNPs.
- HS-LEIS provided experimental SAM thickness values consistent with SESSA-XPS analysis.
- The study demonstrated the speed and effectiveness of HS-LEIS for SAM thickness characterization.
Conclusions:
- HS-LEIS is a valuable and rapid analytical technique for characterizing SAMs on nanomaterials.
- This method enhances the quality control and reproducibility of functionalized nanoparticles for biomedical applications.
- HS-LEIS offers a reliable alternative for detailed surface analysis of nanomaterials.

