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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
1The Key Lab of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400044, China ; The Key Lab of Biorheological Science and Technology of the Education Ministry of China, Chongqing University, Chongqing 400044, China.
Spectral computed tomography (CT) uses K-edge characteristics to differentiate materials. This study optimizes energy bin width using a contrast-to-noise ratio (CNR) criterion for enhanced material discrimination in CT imaging.
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