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Updated: May 4, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
Evidence for the formation of dynamically created pre-formed ions at the interface of isotopically enriched thin
Jordan O Lerach1, Nicholas Winograd1
1Penn State University, Chemistry, University Park, Pennsylvania, USA.
Abstract:
A novel approach to elucidate the ionization mechanism for the [M + H]+ molecular ion of organic molecules is investigated by molecular depth profiling of isotopically enriched thin films. Using a model bi-layer film of phenylalanine (PHE) and PHE-D8, the results show formation of an [M + D]+ molecular ion for the non-enriched PHE molecule attributed to rearrangements of chemical damage due to successive primary ion impacts. The [M + D]+ ion is observed at the interface for 19.9nm in the enriched-on-top system and 9.9nm for the enriched-on-bottom system. This ion formation is direct evidence for dynamically created pre-formed ions as a result of chemical damage rearrangement induced by previous primary ion bombardment events.

