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Updated: May 4, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
New silicon technologies enable high-performance arrays of Single Photon Avalanche Diodes
Angelo Gulinatti1, Ivan Rech1, Piera Maccagnani2
1Politecnico di Milano, Dipartimento di Elettronica, Informazione e Bioingegneria, piazza Leonardo da Vinci 32 - 20133 Milano, Italy.
Abstract:
In order to fulfill the requirements of many applications, we recently developed a new technology aimed at combining the advantages of traditional thin and thick silicon Single Photon Avalanche Diodes (SPAD). In particular we demonstrated single-pixel detectors with a remarkable improvement in the Photon Detection Efficiency at the longer wavelengths (e.g. 40% at 800nm) while maintaining a timing jitter better than 100ps. In this paper we will analyze the factors the currently prevent the fabrication of arrays of SPADs by adopting such a Red-Enhanced (RE) technology and we will propose further modifications to the device structure that will enable the fabrication of high performance RE-SPAD arrays for photon timing applications.
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