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Updated: May 4, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Study on the reflectivity properties of spherically bent analyser crystals
Ari-Pekka Honkanen1, Roberto Verbeni2, Laura Simonelli2
1Department of Physics, PO Box 64, FI-00014 Helsinki, Finland.
Abstract:
Theoretical and experimental studies are presented on properties of spherically bent analyser crystals for high-resolution X-ray spectrometry. A correction to the bent-crystal strain field owing to its finite surface area is derived. The results are used to explain the reflectivity curves and anisotropic properties of Si(660) and Si(553) analysers in near-backscattering geometry. The results from the calculation agree very well with experimental results obtained using an inelastic X-ray scattering synchrotron beamline.
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