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X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon

V A Terekhov1, D I Tetelbaum2, D E Spirin1

  • 1Solid State Physics and Nanostructures Department, Voronezh State University, Universitetskaya pl. 1, Voronezh 394006, Russian Federation.

Journal of Synchrotron Radiation
|December 25, 2013
PubMed

Keywords:
X-ray absorption inversion phenomenonXANESsilicon nanocrystals

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