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Updated: May 4, 2026
Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems
Published on: April 28, 2016
Profiling nanowire thermal resistance with a spatial resolution of nanometers
Dan Liu1, Rongguo Xie, Nuo Yang
1Department of Physics and Centre for Computational Science and Engineering, National University of Singapore , Singapore 117546, Republic of Singapore.
Abstract:
We report a new technique to profile the thermal resistance along a nanowire with a spatial resolution of better than 20 nm. Using this technique, we mapped the thermal conductivity along a Si0.7Ge0.3/NiSi0.7Ge0.3 heterostructured nanowire. We also measured the interfacial thermal resistance (ITR) across the Si/NiSi2 interface embedded in Si/NiSi2 heterostructured nanowires. The ITR does not change even for adjacent interfaces as close as ∼ 50 atomic layers.
