Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Expression of cell-surface activation markers on human CD15<sup>+</sup> cells after selected non esterified fatty acid supplementations.

Lipids in health and disease·2025

Same author

Observation of Mermin-Wagner behavior in LaFeO<sub>3</sub>/SrTiO<sub>3</sub> superlattices.

Nature communications·2024

Same author

Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors.

Scientific reports·2020

Same author

Tumor cell capture from blood by flowing across antibody-coated surfaces.

Lab on a chip·2019

Same author

Hysteretic Characteristics of Pulsed Laser Deposited 0.5Ba(Zr<sub>0.2</sub>Ti<sub>0.8</sub>)O<sub>3</sub>-0.5(Ba<sub>0.7</sub>Ca<sub>0.3</sub>)TiO<sub>3</sub>/ZnO Bilayers.

ACS applied materials & interfaces·2018

Same author

A robust and versatile mass spectrometry platform for comprehensive assessment of the thiol redox metabolome.

Redox biology·2018

Search research articles

Related Experiment Video

Updated: May 4, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Fast and gentle side approach for atomic force microscopy.

W A Wessels¹, J J Broekmaat¹, R J L Beerends²

¹Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands.

The Review of Scientific Instruments

|January 7, 2014

Summary

This summary is machine-generated.

A new atomic force microscopy (AFM) method allows fast, gentle imaging of the same surface location after modifications. This reduces time delays and tip wear, making it widely applicable in various research fields.

More Related Videos

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Published on: June 30, 2023

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

Related Experiment Videos

Last Updated: May 4, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Published on: June 30, 2023

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

Area of Science:

Surface science
Microscopy techniques
Nanotechnology

Background:

Atomic force microscopy (AFM) is a key tool for high-resolution surface imaging across diverse scientific disciplines.
Current AFM methods can involve time delays between surface modification and imaging, and may cause tip degradation.
Reproducibly imaging the same surface location after modifications is crucial for understanding dynamic processes.

Purpose of the Study:

To introduce a novel, fast, and gentle side-approach method for atomic force microscopy.
To enable imaging of the same surface location shortly after modifications.
To minimize tip degradation during repeated imaging cycles.

Main Methods:

Development of a "side approach" technique for atomic force microscopy.
Implementation of rapid repositioning to image identical surface locations.
Utilizing gentle scanning parameters to preserve the AFM tip.

Main Results:

The proposed method significantly reduces the time delay between surface modification and subsequent imaging.
Imaging the same surface location is achieved with minimal tip degradation.
The approach demonstrates reproducibility in imaging after biological, chemical, or physical modifications.

Conclusions:

The fast and gentle side-approach AFM method offers a reproducible way to image modified surfaces.
This technique has the potential for broad adoption in nanoscience and materials research.
It facilitates the study of dynamic surface changes with improved temporal resolution.