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A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
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Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors

M T Do1,2, N Gauquelin3, M D Nguyen4

  • 1MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, Enschede, 7500 AE, The Netherlands. m.t.do@utwente.nl.

Scientific Reports
|May 2, 2020
PubMed

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