Note: Portable rare-earth element analyzer using pyroelectric crystal
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Updated: May 4, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Susumu Imashuku1, Naoto Fuyuno1, Kohei Hanasaki1
1Department of Materials Science and Engineering, Kyoto University, Sakyo, Kyoto 606-8501, Japan.
Abstract:
We report a portable rare-earth element analyzer with a palm-top size chamber including the electron source of a pyroelectric crystal and the sample stage utilizing cathodoluminescence (CL) phenomenon. The portable rare-earth element analyzer utilizing CL phenomenon is the smallest reported so far. The portable rare-earth element analyzer detected the rare-earth elements Dy, Tb, Er, and Sm of ppm order in zircon, which were not detected by scanning electron microscopy-energy dispersive X-ray spectroscopy analysis. We also performed an elemental mapping of rare-earth elements by capturing a CL image using CCD camera.
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