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Updated: May 4, 2026

Fabrication and Optimization of Type II Silicon Clathrate Films
Published on: October 14, 2025
Interaction between SiO2 and a KF-KCl-K2SiF6 Melt
Yurii P Zaykov1, Andrey V Isakov, Irina D Zakiryanova
1Institute of High Temperature Electrochemistry, Ural Branch of Russian Academy of Sciences , S. Kovalevsokaya Street, 22, Akademicheskaya Street, 20, Yekaterinburg, 620990 Russian Federation.
Abstract:
The solubility mechanism of silica in a fluoride-chloride melt has been determined in situ using Raman spectroscopy. The spectroscopy data revealed that the silica solubility process involved Si-O bond breakage and Si-F bond formation. The process results in the formation of silicate complexes, fluorine-bearing silicate complexes, and silicon tetrafluoride in the melt. Mass spectrometry of the vapor phase over the KF-KCl-K2SiF6 and KF-KCl-K2SiF6-SiO2 melts and differential scanning calorimetry coupled with thermal gravimetric analysis of these melts were performed to verify the silica solubility mechanism.
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