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Updated: May 3, 2026

20 mJ, 1 ps Yb:YAG Thin-disk Regenerative Amplifier
Published on: July 12, 2017
Absolute and relative stability of an optical frequency reference based on spectral hole burning in Eu3+:Y2SiO5
David R Leibrandt1, Michael J Thorpe1, Chin-Wen Chou1
1National Institute of Standards and Technology, 325 Broadway Street, Boulder, Colorado 80305, USA.
Abstract:
We present and analyze four frequency measurements designed to characterize the performance of an optical frequency reference based on spectral hole burning in Eu3+:Y2SiO5. The first frequency comparison, between a single unperturbed spectral hole and a hydrogen maser, demonstrates a fractional frequency drift rate of 5×10(-18) s(-1). Optical frequency comparisons between a pattern of spectral holes, a Fabry-Pérot cavity, and an Al(+) optical atomic clock show a short-term fractional frequency stability of 1×10(-15)τ(-1/2) that averages down to 2.5(-0.5)(+1.1)×10(-16) at τ=540 s (with linear frequency drift removed). Finally, spectral-hole patterns in two different Eu(3+):Y2SiO(5) crystals located in the same cryogenic vessel are compared, yielding a short-term stability of 7×10(-16)τ(-1/2) that averages down to 5.5(-0.9)(+1.8)×10(-17) at τ=204 s (with quadratic frequency drift removed).

