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Clarifying and Imaging Candida albicans Biofilms

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Aberration compensation in aplanatic solid immersion lens microscopy.

Yang Lu, Thomas Bifano, Selim Ünlü

|February 12, 2014

Summary

This summary is machine-generated.

Aberrations significantly degrade imaging quality in aplanatic SIL microscopes when sample thickness deviates from the design. A MEMS deformable mirror effectively compensates for these aberrations, restoring near-ideal imaging performance.

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Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

Area of Science:

Optical microscopy
Aberration optics

Background:

Aplanatic solid immersion lens (SIL) microscopes offer high resolution.
Image quality is sensitive to sample thickness deviations from the microscope's design parameters.

Purpose of the Study:

To model and experimentally validate the impact of sample thickness errors on aplanatic SIL microscope imaging.
To demonstrate a method for aberration compensation to restore imaging quality.

Main Methods:

Modeling of aberrations caused by sample thickness errors.
Experimental measurements using a high numerical aperture (NA ~3.5) aplanatic SIL microscope.
Compensation of aberrations using a Micro-Electro-Mechanical Systems (MEMS) deformable mirror.

Main Results:

Significant image quality degradation was observed with sample thickness variations.
The developed model accurately predicted the measured aberrations.
The MEMS deformable mirror successfully compensated for aberrations, recovering near-ideal imaging quality.

Conclusions:

Sample thickness is a critical parameter for high-quality imaging in aplanatic SIL microscopes.
Aberration compensation using MEMS deformable mirrors is a viable technique to overcome thickness-induced image degradation.