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Refractive index measurements of multiple layers using numerical refocusing in FF-OCT
Optics Express
|February 12, 2014
Summary
A new method uses numerical refocusing in full field optical coherence tomography (FF-OCT) to measure the refractive index (RI) and thickness of individual layers in multilayered samples accurately.
Area of Science:
- Optical Physics
- Metrology
- Materials Science
Background:
- Refractive index (RI) and thickness are critical material properties.
- Measuring these properties in multilayered samples can be challenging.
- Full Field Optical Coherence Tomography (FF-OCT) offers non-invasive imaging capabilities.
Purpose of the Study:
- To develop and demonstrate a novel method for measuring the RI and thickness of individual layers in multilayered samples.
- To utilize numerical refocusing in FF-OCT for this purpose.
- To validate the method's accuracy and reliability.
Main Methods:
- Employing numerical refocusing by adjusting the image sensor plane in FF-OCT.
- Calculating sample shift and comparing it with actual shift to determine layer RI.
- Extracting layer thickness simultaneously with RI measurement.
- Preparing multilayered samples with varying materials and refractive indices.
Main Results:
- Accurate measurement of refractive indices for oils ranging from 1.2977 to 1.3857, with agreement within 0.205% of reported values.
- Successful extraction of oil RI and physical thickness from multilayered stacks with average errors of 0.065% and 0.990%, respectively.
- Demonstrated capability to measure properties of individual layers within complex stacks.
Conclusions:
- The proposed numerical refocusing method in FF-OCT is effective for precise RI and thickness determination of layers in multilayered samples.
- This technique offers a significant advancement for material characterization in various scientific and industrial applications.
- The method shows high accuracy and robustness even with complex sample structures.

