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Updated: May 2, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Expected thermal deformation and wavefront preservation of a cryogenic Si monochromator for Cornell ERL beamlines
Rong Huang1, Donald H Bilderback1, Kenneth Finkelstein1
1Cornell High Energy Synchrotron Source, Cornell University, 161 Synchrotron Drive, Ithaca, NY 14853, USA.
Abstract:
Cornell energy-recovery linac (ERL) beamlines will have higher power density and higher fractional coherence than those available at third-generation sources; therefore the capability of a monochromator for ERL beamlines has to be studied. A cryogenic Si monochromator is considered in this paper because the perfect atomic structure of Si crystal is needed to deliver highly coherent radiation. Since neither the total heat load nor the power density alone can determine the severity of crystal deformation, a metric called modified linear power density is used to gauge the thermal deformation. For all ERL undulator beamlines, crystal thermal deformation profiles are simulated using the finite-element analysis tool ANSYS, and wavefront propagations are simulated using Synchrotron Radiation Workshop. It is concluded that cryogenic Si monochromators will be suitable for ERL beamlines in general.

